DM-SC08-IOL-PN
Sensors for Semiconductor Manufacturing
Measurement and motion components for wafer handling, process cooling, gas delivery and metrology, where drift of a few tenths of a degree changes the yield.
Semiconductor equipment is specified in a different unit of tolerance. A temperature uniformity of ±0.5 °C across a 300 mm wafer, a flow repeatability of 0.5% on a cooling loop, a stage that holds position within 50 nm: these are not process control targets, they are the conditions under which the process works at all.
Our semiconductor range is small and deliberately narrow. Thin-film RTDs with low mass for fast, accurate chamber and chuck measurement. Clamp-on and inline flow meters for process cooling water and CDS loops. Micro actuators and flexure stages for wafer handling and optical alignment. IO-Link and signal conditioning to bring the data into the tool controller without adding analogue cards.
Fab customers also need material declarations, particle-shedding data and cleanroom-compatible packaging. We supply those with the first article, not on request after the order.
Application Reality
What actually goes wrong here
These are the failure modes we are called in to solve, and the specification change that addresses each one.
Temperature uniformity across the wafer
A single-point measurement cannot prove uniformity. Multiple thin-film RTDs with matched calibration and a low-mass design show the real gradient without averaging it away.
Cooling loop flow stability
A 2% flow error on process cooling shifts the chuck temperature and the process result. Clamp-on ultrasonic meters on the loop give repeatable measurement without breaking into the supply.
Particle and outgassing limits
Standard cable jackets and lubricants outgas in a vacuum chamber and shed particles near the wafer. Vacuum-compatible materials and cleanroom packaging are specified for in-chamber parts.
Nanometre positioning with zero backlash
A screw drive has backlash; a piezo has almost no stroke. A flexure stage with a piezo fine axis separates the two problems and gives both travel and resolution.
Long qualification cycles
Changing a component in a tool can trigger a full requalification. We keep form, fit and function stable and provide a comparability package when a revision is unavoidable.
Products
Specified for semiconductor applications
DM-MA08-PZ-8UM
DM-MA08 Piezo Micro Actuator, 8 µm Stroke, 0.1 nm Resolution
DM-MA25-LIN-80
DM-MA25 Linear Micro Actuator, 25 mm Stroke, 80 N
DM-TI300-IR-1200
DM-TI300 Infrared Pyrometer, 0-1,200 °C
DM-FE150-CL-600
DM-FE150 Clamp-On Ultrasonic Flow Meter, DN15-DN600
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Standards
What the audit will ask for
| Standard | Requirement |
|---|---|
| SEMI S2 / S8 | Equipment safety and ergonomics |
| ISO 14644 Class 5 | Cleanroom particle limits |
| RoHS / REACH | Material restriction compliance |
| SEMI F57 (UPW contact) | Ultrapure water compatibility |
Application Example
Chuck temperature uniformity, etch tool
Situation
An etch tool was showing a 1.8 °C edge-to-centre gradient on the electrostatic chuck, outside the process window, with the existing single-point sensor reading nominal.
What we changed
We supplied a matched set of four thin-film RTDs with pair calibration, mounted at the chuck periphery and centre, and a multi-channel conditioner feeding the tool controller.
Result
The gradient was measured and then corrected through the chiller setpoint, bringing uniformity to 0.4 °C and recovering the yield loss attributed to the edge zone.
FAQ
Semiconductor instrumentation questions
Can your sensors be used inside a process chamber?
Selected thin-film RTDs and micro actuators are built with vacuum-compatible materials for in-chamber use at pressures down to 10⁻⁶ mbar. State the pressure, the bake-out temperature and the gas chemistry when you enquire.
How do you prove temperature uniformity?
With multiple calibrated sensors, not one. A matched set of thin-film RTDs, individually calibrated and mounted at the points that matter, gives a real gradient measurement. A single sensor tells you the temperature at one point and nothing about uniformity.
What flow meter suits process cooling water?
Clamp-on ultrasonic for existing loops where you cannot break in, inline electromagnetic where accuracy matters and a shutdown is acceptable. For UPW, specify PVDF or PFA wetted parts per SEMI F57.
Do you provide particle shedding data?
For cleanroom and in-chamber parts we supply particle shedding and outgassing test reports with the first article. The tests are subcontracted to an accredited laboratory and the reports reference the specific part number.
What is the lead time for a cleanroom build?
Four to six weeks, including cleanroom assembly, double bagging and the documentation package. Standard catalogue items ship from stock in 5-10 working days.
Other industries
Send the application details and get a specification back within one business day.